Wooptix collaborates with poLight ASA on their Phase RT1000 Camera The benefits provided by poLight’s TLens® include focus, repeatability, and speed April 17 2024 – Wooptix, an expert in optical metrology through wavefront phase, and poLight ASA (OSE:PLT), developer of innovative tunable optics technology, have recently announced their collaboration in the production of the […]
SEBI Proceeding will be presented at SPIE EUROPE Wooptix will be speaker at SPIE Optical Systems Design and at SPIE Photonics Europe Madrid April 2024 – Next week Strasbourg will be the hub for a key Event, around the Photonics and the Optical Systems: SPIE Photonics Europe and SPIE Optical Systems Design. “Hear research presented […]
Wooptix launches the RT1000 Phase Camera Development Kit SEBI® RT1000 results in substantially better visibility of important details. “Disruptores” published a complete article about the SEBI RT1000 launching Madrid 03/05/2024 – Wooptix, an expert in optical metrology, launches the Development Kit of its Phase Camera SEBI® RT1000, following the successful results obtained during the […]
New Wooptix Poster at SPIE Advanced Lithography and Patterning Jan O. Gaudestad presented the Poster “A new optical metrology technique for measuring the shape of a lithography photomask” MADRID- 29th.02.24 SPIE Advanced Lithography and Patterning Conference, taking place between February 25th and February 28th in San Jose (California), took the attention from the entire semiconductor […]
Compact and versatile wavefront sensor for current and emerging challenges Wooptix presents at the Spanish Optical Design Meeting (ESODM 24) its latest data on the SEBI® RT1000 Madrid – 01/30/2024. Wooptix, an expert in optical metrology, will present its latest data on the wavefront sensor at ESODM 24. Under the title, “Compact and […]
Wooptix presents its latest data on WFPI at SPIE Photonics West in San Francisco Wooptix will present its latest data on WFPI (Wave Front Phase Imaging) in San Francisco on January 30. Titled “Repeatability Study of Silicon Wafer Shape Measurements”, the presentation will take place at Moscone Center, Room 312 (Level 3 South), at 2:10 […]
Wooptix: Latest solution for on-product overlay for wafer-to-wafer bonding processes Wooptix, with its advanced silicon wafer shape measurement technique, is set to be an important contributor to the future of Semiconductor Advanced Packaging To accomplish the challenging task of accurately overlaying two wafers during the hybrid wafer-to-wafer bonding process, an accurate wafer shape […]
The 3D Metrology Congress includes “Characterization of wavefront phase sensors” by Wooptix Wooptix, participates this week at the prestigious 3D Metrology Event. The 3DMC is now celebrating its 8th Edition in Bilbao. The organization of the event communicates the the 3DMC celebration in the Basque Country. “For our 8th event we will be working […]
New technique for measuring free-form wafer shape for feed-forward overlay corrections will be highlighted at SPIE EUV Lithography 2023 Wooptix will present a scientific paper at SPIE EUV Lithography, held in Monterey California October 1st through October 5th under the title “New technique for measuring free-form wafer shape for feed-forward overlay corrections” written in […]
Wooptix expands its Clean Rooms and prepares 400 m² more to work in Semiconductor Metrology. The clean rooms, which are located in the Nanotec building, in La Laguna (Tenerife), are complementing the investment in infrastructure that the company began two years ago. Wooptix has announced the successful progress in the development of its two […]
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