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Press Release
Silicon Wafer during Photolithography Process

Wooptix: 39th Mask and Lithography Conference

New Optical Metrology Method for Measuring Shape of a Lithography Photo Mask Wooptix participates in the 39th Mask and Lithography Conference in Grenoble, presenting its latest results in Optical Metrology Wooptix has recently presented a groundbreaking optical metrology method at the 39th Mask and Lithography Conference in Grenoble. This new technique promises to revolutionize the […]

Press Release
Wooptix and Prodrive Technologies sign declaration of intent for strategic partnership

Wooptix and Prodrive: Strategic Partnership

Wooptix and Prodrive Technologies sign declaration of intent for strategic partnership The partnership is aimed at supporting Wooptixs’ development in semiconductor metrology through WaveFront Phase Imaging (WFPI) SCIENCE PARK EINDHOVEN (date, 2024) Prodrive Technologies and Wooptix have signed a memorandum of understanding to further strengthen their long-term strategic partnership. The partnership is aimed at supporting […]

Press Release
ASMC

Wooptix in ASMC 2024

Wooptix in ASMC 2024 The semiconductor metrology expert will present on May 14th at ASMC with the Title 3D shape measurements of patterned silicon wafers Madrid 13th May 2024. Wooptix, the semiconductor metrology expert using Wavefront Phase Detection, has presented today at the Advance Semiconductor Manufacturing Conference (ASMC). The event is taking place from May […]

Press Release
poLigh

Wooptix collaborates with poLight ASA on their Phase RT1000 Camera

Wooptix collaborates with poLight ASA on their Phase RT1000 Camera The benefits provided by poLight’s TLens® include focus, repeatability, and speed   April 17 2024 – Wooptix, an expert in optical metrology through wavefront phase, and poLight ASA (OSE:PLT), developer of innovative tunable optics technology,  have recently announced their collaboration in the production of the […]

Press Release
SEBI RT1000

Wooptix launches the RT1000 Phase Camera

Wooptix launches the RT1000 Phase Camera Development Kit SEBI® RT1000 results in substantially better visibility of important details. “Disruptores” published a complete article about the SEBI RT1000 launching   Madrid 03/05/2024 – Wooptix, an expert in optical metrology, launches the Development Kit of its Phase Camera SEBI® RT1000, following the successful results obtained during the […]

Press Release
Automated material system lines for wafers in semiconductor production fab cleanroom

SPIE Advanced Lithography and Patterning

New Wooptix Poster at SPIE Advanced Lithography and Patterning Jan O. Gaudestad presented the Poster “A new optical metrology technique for measuring the shape of a lithography photomask” MADRID- 29th.02.24 SPIE Advanced Lithography and Patterning Conference, taking place between February 25th and February 28th in San Jose (California), took the attention from the entire semiconductor […]

Press Release

Wooptix at ESODM 24

Compact and versatile wavefront sensor for current and emerging challenges   Wooptix presents at the Spanish Optical Design Meeting (ESODM 24) its latest data on the SEBI® RT1000   Madrid – 01/30/2024. Wooptix, an expert in optical metrology, will present its latest data on the wavefront sensor at ESODM 24. Under the title, “Compact and […]

Press Release

WFPI at SPIE Photonics West

Wooptix presents its latest data on WFPI at SPIE Photonics West in San Francisco Wooptix will present its latest data on WFPI (Wave Front Phase Imaging) in San Francisco on January 30. Titled “Repeatability Study of Silicon Wafer Shape Measurements”, the presentation will take place at Moscone Center, Room 312 (Level 3 South), at 2:10 […]

Press Release

Semicon Europa

Wooptix: Latest solution for on-product overlay for wafer-to-wafer bonding processes Wooptix, with its advanced silicon wafer shape measurement technique, is set to be an important contributor to the future of Semiconductor Advanced Packaging        To accomplish the challenging task of accurately overlaying two wafers during the hybrid wafer-to-wafer bonding process, an accurate wafer shape […]

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