Roughness Measurement of a Silicon Wafer Using Wave Front Phase Imaging / August 2020
New high-resolution wave ophthalmic instrument for the characterizing ocular optics / February 2020
Wavefront phase imaging for global and local wafer geometry / February 2020
Wave front phase imaging of wafer geometry using high pass filtering to reveal nanotopography / January 2020
Exposing parallelism of discrete radon transform / November 2019
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