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Intel Accelerates AI at the Edge

Intel Accelerates AI at the edge Through an Open Ecosystem By 2025, half of enterprise data will be processed outside data centers   Intel is unveiling its new Intel® AI Edge Systems, Edge AI Suites and Open Edge Platform initiatives. These offerings help streamline and speed up AI adoption at the edge across industries such […]

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Silicon Semiconductor Interview

Silicon Semiconductor interviews Wooptix Phil Alsop, Editor in Silicon Semiconductor interviews Javier Elizalde, COO at Wooptix The semiconductor sector is undergoing rapid transformation, largely driven by artificial intelligence (AI). The demands for precision and speed in semiconductor manufacturing have reached new levels, presenting both challenges and opportunities. Wooptix, with its innovative metrology technology based on wavefront […]

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Global Semiconductor Sales

Global Semiconductor Sales

Global Semiconductor Sales Increase 19.1% in 2024  Double-Digit Growth Projected in 2025   WASHINGTON—Feb. 7, 2025—The Semiconductor Industry Association (SIA) today announced global semiconductor sales hit $627.6 billion in 2024, an increase of 19.1% compared to the 2023 total of $526.8 billion. Additionally, fourth-quarter sales of $170.9 billion were 17.1% more than the fourth quarter of […]

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SPIE Advanced Lithography + Patterning

Wooptix at SPIE Advanced Lithography + Patterning Wooptix presented the integration strategy of Wooptix and Pollen Technologies   Wooptix participated in SPIE Advanced Lithography + Patterning, a leading event for emerging technologies in the semiconductor industry, held in San Jose from February 25 to 26. The company was represented by Javier Elizalde (COO), Sebastien Pauliac […]

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Final composed image after stitching 196 images

New MDPI Paper

Stitching-Based Resolution Enhancement in Wavefront Phase Measurement of Silicon Wafer Surfaces Kiril Ivanov Kurtev, Juan Trujillo Sevilla, and .José Manuel Rodriguez Ramos have recently participated in the publication of a research paper, on the application of advanced wavefront phase measurement techniques for silicon wafer inspection, a critical aspect in the semiconductor manufacturing process. The research, […]

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Wooptix at SPIE Photonics West

Wooptix at Photonics West 2025 Wooptix Presents a Poster on Novel Characterization of Borosilicate Transparent Wafers Using Wavefront Phase Imaging   Wooptix recently presented a poster titled “Novel Characterization of Borosilicate Transparent Wafers Using Wavefront Phase Imaging” at Photonics West 2025. This cutting-edge research demonstrated a new, highly precise technique for characterizing borosilicate transparent wafers—an […]

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Valencia

Photonic Future Chip

The photonic chip of the future: at the Polytechnic University of Valencia UPVfab and the iTEAM Institute will lead the European Pilot Line for Photonic Chips The Chips Programme of the European Commission has just selected the PIXEurope initiative, in which the UPVfab laboratory and the iTEAM Institute of the Polytechnic University of Valencia participate […]

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Laser welding and 3D printing to new heights

Deformable mirror technology takes laser welding and 3D printing to new heights With further research, the technology will be ready for full-scale production in the coming years Yongcui Mi, a newly minted Ph.D. in Production Technology from University West, has developed an innovative technology that enables the real-time shaping and control of laser beams, which […]

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Germany: Chip Skills Academy

Germany: €12 million chip skills academy The project aims to tackle the growing skills gap in microelectronics In a bold move to secure its place at the forefront of the microelectronics industry, Germany has launched the “Skills4Chips” initiative. With the Microtec Academy as its centerpiece, this €12 million project, funded entirely by the Federal Ministry […]

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Active Control in Space Telescopes

Active Control in Membrane Space Telescopes: A wavefront Sensing Revolution   Advancing space telescopes depends heavily on innovating the design of their primary mirrors, which determine the instrument’s sensitivity and resolution. In the paper “Membrane Space Telescope: Active Surface Control with Radiative Adaptive Optics”, S. Rabien, L. Busoni, C. Del Vecchio, J. Ziegleder, and S. […]