PHEMET® White Paper Revolutionizing Semiconductor Metrology with Cutting-Edge Precision and Efficiency Phemet® works thanks to the WFPI technique developed by Wooptix. This technique analyzes the intensity of the light distribution reflected by the silicon wafer in two conjugated planes. These planes allow us to get data from both sides of the wafer and compare […]
New Optical Metrology Method for Measuring Shape of a Lithography Photo Mask Wooptix participates in the 39th Mask and Lithography Conference in Grenoble, presenting its latest results in Optical Metrology Wooptix has recently presented a groundbreaking optical metrology method at the 39th Mask and Lithography Conference in Grenoble. This new technique promises to revolutionize the […]
Wooptix presents its latest data on WFPI at SPIE Photonics West in San Francisco Wooptix will present its latest data on WFPI (Wave Front Phase Imaging) in San Francisco on January 30. Titled “Repeatability Study of Silicon Wafer Shape Measurements”, the presentation will take place at Moscone Center, Room 312 (Level 3 South), at 2:10 […]
TV1 Interviews Wooptix´s CEO José Manuel Rodriguez, CEO at Wooptix, explains to ZEC the upcoming Fully Automated Fab Tool expected in 2024
Wooptix Highlights 2023 We present a resume of our best PR Actions in 2023. Enjoy the Reel!
Wooptix: Latest solution for on-product overlay for wafer-to-wafer bonding processes Wooptix, with its advanced silicon wafer shape measurement technique, is set to be an important contributor to the future of Semiconductor Advanced Packaging To accomplish the challenging task of accurately overlaying two wafers during the hybrid wafer-to-wafer bonding process, an accurate wafer shape […]
The 3D Metrology Congress includes “Characterization of wavefront phase sensors” by Wooptix Wooptix, participates this week at the prestigious 3D Metrology Event. The 3DMC is now celebrating its 8th Edition in Bilbao. The organization of the event communicates the the 3DMC celebration in the Basque Country. “For our 8th event we will be working […]
Wooptix expands its Clean Rooms and prepares 400 m² more to work in Semiconductor Metrology. The clean rooms, which are located in the Nanotec building, in La Laguna (Tenerife), are complementing the investment in infrastructure that the company began two years ago. Wooptix has announced the successful progress in the development of its two […]
Wooptix closes €10 million Series B financing round The round is participated by: Bullnet Capital, CDTI (Centre for the Development of Technology and Innovation), Danobatgroup , European Innovation Council Fund (EIC), Fagor Automation, Intel Capital and Mondragón Promotion Fund Wooptix has announced the signing of a 10 million euro Series B financing round. The […]
Jan Olaf Gaudestad, Wooptix VP of Business Development will present a poster session from 12.30 to 13.30 the Wednesday 28th, with the last research advances in Semiconductors Metrology. Madrid June 2023. Wooptix, Leader in Semiconductor Metrology through wavefront phase imaging, will participate in the Munich SPIE Optical Metrology from 26th to 29th June. This event […]