Jan Olaf Gaudestad, Wooptix VP of Business Development will present a poster session from 12.30 to 13.30 the Wednesday 28th, with the last research advances in Semiconductors Metrology.
Madrid June 2023. Wooptix, Leader in Semiconductor Metrology through wavefront phase imaging, will participate in the Munich SPIE Optical Metrology from 26th to 29th June. This event highlights the latest advances in optical measurement systems. SPIE states that, “It is the meeting for emerging photonics fields within measurement systems, modelling, imaging, sensing, and inspection”.
The event will address a variety of technologies and applications:
• Optical measurement systems.
• Modelling aspects in optical metrology.
• Optics for arts, architecture, and archaeology.
• Multimodal sensing and artificial intelligence technologies and applications.
• Optical methods for inspection, characterization, and imaging of biomaterials.
• Automated visual inspection and machine vision.
Wooptix is presenting a very Interesting Paper:
Jan Olaf Gaudestad, Wooptix VP of Business Development, will present in the poster session from 12.30 to 13.30 on Wednesday the 28th of June with the last research advances in Semiconductors Metrology achieved by the company. As the SPIE organization says, “Authors of poster papers will be present to answer questions concerning their papers”. The Wooptix Abstract is public and can be read here.
Phemet®: new semiconductor metrology technique
Acquiring more than 10 million data points with sub-nanometer height resolution in just seconds, Wave Front Phase Imaging Phemet® is the semiconductor industry leader in speed and resolution. With the ability to measure the shape of both blank and patterned wafers in the same system, the wafer manufacturer, as well as the semiconductor device maker, will take advantage of the speed and accuracy offered by Phemet®.
Wave Front Phase Imaging Phemet® is offered as a manually operated 300mm wafer lab tool for evaluation of the upcoming fully automated fab tool with robotic handlers. The system comes in one version for ordinary warped wafers (±300µm). The custom software allows the system to measure 50mm, 150mm, 200mm and 300mm wafers using different analysis modules.
About SPIE Optical Metrology 2023
SPIE Optical Metrology 2023 is the conference offering the latest research in measurement systems, modeling, videometrics, and inspection. You can get more information here
Wooptix is a leader in semiconductor metrology through wavefront phase imaging, a technique coming derived from adaptive optics research in astronomy. With a multidisciplinary team, Wooptix aims to disrupt the semiconductor metrology industry with the highest lateral resolution and fastest measurement technique for inline fab measurements.
The company has developed Phemet®, a wafer shape lab tool for blank and patterned wafers, ahead of the upcoming fully automated fab tool, expected in 2024. Wooptix has already deployed the lab tool at several customer sites worldwide.
Wooptix is based at Tenerife, Madrid (Spain) and San Francisco (USA).