Over 10 years we help companies reach their financial and branding goals. Engitech is a values-driven technology agency dedicated.

Gallery

Contacts

411 University St, Seattle, USA

[email protected]

+1 -800-456-478-23

Twitter Facebook-f Pinterest-p Instagram

Nanotopography Blank Wafer Geometry

Nanotopography:
Blank wafer geometry

Utilizing a distinctive vertical wafer grip, PHEMET metrology system offer comprehensive measurement of both front and back wafer surfaces simultaneously, eliminating the impact of gravitational distortion.

Phemet® offers a singular measurement yields a range of wafer metrics, including:

  • Warp and bow
  • In-plane displacement
  • Stress-induced local curvature
  • Variation in wafer thickness and flatness
  • Nanotopography (NT) of both front and back surfaces
  • Wafer edge roll-off (ERO)
More Information

blank wafer

Are you interested in more information?

Please Fill this Form and we will keep in contact with you.

Ready to Get Started?

Your email address will not be published. Required fields are marked *