PHEMET® White Paper Revolutionizing Semiconductor Metrology with Cutting-Edge Precision and Efficiency Phemet® works thanks to the WFPI technique developed by Wooptix. This technique analyzes the intensity of the light distribution reflected by the silicon wafer in two conjugated planes. These planes allow us to get data from both sides of the wafer and compare […]
White Papers
SEBI RT 1000 White Paper High-Resolution Real-Time Wavefront Sensing Using an Electrically Tunable Lens A phase camera is an instrument that can simultaneously measure the intensity and wavefront aberrations of the incoming light, turning this data into thorough maps. As technology evolves, there’s a growing need to use the highest possible resolution within the […]