Juan Manuel Trujillo-Sevilla, Jose Manuel Ramos-Rodríguez, Jan Gaudestad
Wavefront phase imaging (WFPI) is a new technique to measure wafer geometry on a full wafer in a single image snapshot providing depth information for every pixel. The number of topography data points for the entire wafer will be proportional to the number of pixels in the image sensor, allowing for millions of data points to be acquired in less than a second.
Juan Manuel Trujillo, Jose Manuel Ramos-Rodríguez, Jan Gaudestad
In this paper we show that Wave Front Phase Imaging (WFPI) has high lateral resolution and high sensitivity enabling it to measure nanotopography and roughness on a silicon wafer by simply acquiring a single image of the entire wafer. WFPI is achieved by measuring the reflected light intensity from monochromatic…
Óscar Gómez, Ricardo Oliva, Gabriel A. Rodríguez, José G. Marichal
Discrete Radon Transform, DRT, is an integral transform that computes the complete set, in terms of slope and intercepts, of line integrals through a two-dimensional domain. It exhibits linearithmic computational complexity and avoids the usage of real numbers thanks to a divide and conquer, or multiscale, approach with a loose definition of discrete lines.
José Manuel Rodríguez-Ramos, Alex Roqué, David Carmona, Jan Gaudestad
We will discuss here the applications of the Wavefront Phase Imaging sensor (WFPI) on Adaptive Optics (AO) for Astronomy. The WFPI sensor is based on registering the intensity distribution at two different optical planes by a conventional imaging sensor. In the geometrical approximation, the light can be considered as a collection of light rays which bends according to Snellen’s law.
José Manuel Rodríguez-Ramos, Jan Gaudestad, Juan Manuel Trujillo
In this paper we show that Wave Front Phase Imaging (WFPI) has good enough lateral resolution and is sensitive enough to measure roughness on a silicon wafer by simply acquiring a simple image of the entire wafer. WFPI is achieved by measuring the reflected light intensity from monochromatic uncoherent light at two different planes along the optical path with the same field of view.
Miriam Velasco, Sergio Bonaque, Juan Manuel Trujillo, Jose Manuel Rodríguez Ramos
In this work we present a new method for optical characterization of glass samples. It is based on a new wavefront sensor method developed by the image processing specialist company Wooptix. With this novel wavefront phase sensor and a simple optical arrangement we have performed an objective optical characterization of glass specimens…
Ricardo Oliva, Óscar Gómez, David Carmona, José G. Marichal, José M Rodríguez-Ramos
Discrete Radon transform is a technique that allows to detect lines in images. It is much lighter to compute than Radon transforms based on Fourier slice theorem that use FFT as basis computing block. Even then, it is not that prone to optimal fine grain parallelization due to the need of running 4 passes to mirrored and flipped versions of the input…
David Carmona, Viana L. Guadalupe, Juan Manuel Trujillo, Sergio Bonaque, Ricardo Oliva, Jose G. Marichal, Miguel J. Sicilia, Lara Díaz, José Manuel Rodríguez-Ramos
We present our latest advances in the design and implementation of a tunable automultiscopic display based on the tensor display model. A design comprising a three-layer display was introduced. In such design, front and rear layers were enabled to be controlled in a six-degree of freedom manner related to the central layer of the system.
José Manuel Rodríguez-Ramos, Jan Gaudestad, Juan Manuel Trujillo
We present a new wafer metrology technique, Wave Front Phase Imaging (WFPI), for high speed measurement of wafer geometry including shape, flatness, nanotopography and even sub nm features found in roughness. WFPI acquires data of the entire wafer using a single image snapshot that provides depth data for every single pixel.
David Carmona, Juan Manuel Trujillo, Sabato Ceruso, Oscar Casanova
In this work we present a novel application in the field of shoulder-surfing prevention by using a light-field display consisting of a multilayered structure of LC screens. By controlling the directionally displayed content, we can discriminate between authorized and unauthorized observers. Optimizations regarding different parameters were assessed, i.e, number of unauthorized/authorized observers, quality and complexity of the contents, and physical limitations. Tests were made in simulations and a real model implementation.