This work introduces a real-time full-resolution depth estimation device, which allows integral displays to be fed with a real-time light-field. The core principle of the technique is a high-speed focal stack acquisition method combined with an efficient...
The conference named “New optical metrology technique for shape measurements of blank and patterned silicon wafers” will take place the 21 th Wednesday of June. Wooptix Labtool Madrid 19th June 2023. Next June, from 19th to 21th will...
Publication number: 20220383525 Abstract: The disclosure relates to a method including: capturing a sequence of images of a scene with a camera at different focus positions according to a predetermined focus schedule that specifies a chronological sequence of focus...
Publication number: 20210089736 Abstract: The invention relates to a computer-implemented method for detecting barcodes in a digital image represented as a two-dimensional digital image array comprising: applying a filter to the image array, computing a discrete Radon...
Publication number: 20100091146 Abstract: A system consisting of a phase camera with microlenses placed in the focal point of a converging lens, wherein the camera data, processed using a combined Fourier “Slice” and fast Fourier transform edge detection technique,...
