SANTIAGO BASALLO
Before talking about the advantages of light field images applied to social networks, I would like to specify a little what is understood by light field (LF) image from my graphic designer point of view.
T·EYEDE TEAM
Ocular optics is normally estimated based on 2,600 measurement points within the pupil of the eye, which implies a lateral resolution of approximately 175 microns for a 9 mm pupil diameter.
ÓSCAR GÓMEZ
3D photography is not usually enjoyed by everyone. I explored what are the possibilities of capturing and displaying stereoscopic images without the need for specific hardware with interesting results.
JAVIER MARTIN
Let start with Virtual reality. This term is far from being new to us, it has been with us since 1938, and it was really popularized in the 80 decades. As we have already defined reality in our last post, we should only answer. what is Virtual?
Wooptix’ team with the collaboration of Damien Gatinel & Jack T. Holladay
In this work, we characterize the in vivo ocular optics of the human eye with a lateral resolution of 8.6 microns, which implies roughly 1 million measurement points for a pupil diameter of 9 mm. The results suggest that the normal human eye presents a series of hitherto unknown optical patterns.
JAN OLAF GAUDESTAD
The SEMI International Standards Program is a key service that brings together the global semiconductor equipment makers and the device makers.
JAVIER MARTIN
While we have grown accustomed to reading about AR, are we capable of defining it? We have some clear images of what constitutes AR, but, are we even sure what is not considered AR?
SABATO CERUSO & RICARDO OLIVA
Multiple technologies like light-field, laser imaging detection and ranging (LIDAR), infrared (IR) or stereo can also obtain the depth information, that is useful for a better understanding of the scene.
JAN OLAF GAUDESTAD
New technology is required by the semiconductor industry. We present a technology that is faster than any existing fab metrology systems and meets both the demands.
Juan Manuel Trujillo-Sevilla, José Manuel Rodríguez-Ramos, Jan Olaf Gaudestad
In this paper we introduce a new metrology technique for measuring wafer geometry on silicon wafers. Wave Front Phase Imaging (WFPI) has high lateral resolution and is sensitive enough to measure roughness on a silicon wafer by simply acquiring a single image snapshot of the entire wafer.